K-Alpha XPS
K-Alpha XPS
- High resolution XPS
- Fast, efficient, automated workflow
- Ion source for depth profiling
Nexsa G2 XPS
Nexsa G2 XPS
- Micro-focus X-ray sources
- Unique multi-technique options
- Dual-mode ion source for monoatomic & cluster ion depth profiling
ESCALAB QXi XPS
ESCALAB QXi XPS
- High spectral resolution
- Multi-technique surface analysis
- Extensive sample preparation and expansion options
