Abdulla Fouad For Medical Supplies & Services

Floor Standing Electron Microscopes

Complete portfolio of floor standing electron microscopes including Scanning Electron Microscopes (SEMs), Transmission Electron Microscopes (TEMs) and Dual Beam Focused Ion Beam (FIB) Scanning Electron Microscopes.

Scanning Electron Microscopes

Thermo Scientific™ Floor Standing SEM models offer the flexibility and versatility to meet a wide range of academic and industrial needs; support for large and heavy samples, a very wide range of accessories, excellent imaging quality for the most challenging materials or the smallest details, and dynamic experimentation.

   Scanning Electron Microscopes General Portfolio

Axia ChemiSEM

  • Live quantitative elemental mapping
  • High fidelity scanning electron microscopy imaging
  • Flexible and easy to use, even for novice users
  • Easy maintenance

 Data Sheet

Verios 5 XHR SEM

  • Monochromated SEM for sub-nanometer resolution over the full 1 keV to 30 keV energy range
  • Easy access to beam landing energies as low as 20 eV
  • Excellent stability with piezo stage as standard

 Data Sheet

Quattro ESEM

  • Ultra-versatile high-resolution FEG SEM with unique environmental capability (ESEM)
  • Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation

 Data Sheet

Prisma E SEM

  • Entry-level SEM with excellent image quality
  • Easy and quick sample loading and navigation for multiple samples
  • Compatible with a wide range of materials thanks to dedicated vacuum modes

 Data Sheet

Apreo 2 SEM

  • High-performance SEM for all-round nanometer or sub-nanometer resolution
  • In-column T1 backscatter detector for sensitive materials contrast
  • Excellent performance at long working distance (10 mm)

 Data Sheet

VolumeScope 2 SEM

  • Isotropic 3D data from large volumes
  • High contrast and resolution in high and low vacuum modes
  • Simple switch between normal SEM use and serial block-face imaging
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 Data Sheet

Transmission Electron Microscopes

Transmission electron microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image. The electron beam is impacted by the sample’s thickness/density, composition, and in some cases, crystallinity. The electrons that are transmitted through the specimen subsequently provide contrast in the resulting image. 

Transmission Electron Microscopes can routinely collect sub-nanometer scale (if not atomic-resolution) images.

Tundra Cryo-TEM

  • Structural information at biologically relevant resolution
  • Space efficient and cost effective
  • Easy, iterative sample optimization
  • Unique AI algorithms for streamlined data collection
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 Data Sheet

Krios G4 Cryo-TEM

  • Improved ergonomics
  • Fits more easily into new and existing labs
  • Maximized productivity and automation
  • Best image quality for high-resolution 3D reconstruction

 Data Sheet

Spectra Ultra TEM

  • New imaging and spectroscopy capabilities on the most beam sensitive materials
  • A leap forward in EDX detection with Ultra-X
  • Column designed to maintain sample integrity

 Data Sheet

Spectra 300 TEM

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system
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 Data Sheet

Spectra 200 TEM

  • High-resolution and contrast imaging (voltage 30-200 kV)
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

 Data Sheet

Glacios 2 Cryo-TEM

  • High-resolution structure determination tool (<3Å)
  • Unparalleled ease-of-use through AI-enhanced automation
  • Flexible modes of operation standard: SPA, tomography, MicroED

 Data Sheet

Metrios AX TEM

  • Automation options to support quality, consistency, metrology, and reduced OPEX
  • Workflows for both in-situ and ex-situ lamella preparation
  • Leverages machine learning for superior autofunctions

 Data Sheet

Talos L120C TEM

  • Increased stability
  • 4k × 4K Ceta CMOS camera
  • TEM magnification range from 25–650 kX
  • Flexible EDS analysis reveals chemical information
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 Data Sheet

Talos F200i TEM

  • High-quality, high-resolution (S)TEM imaging and flexible EDS
  • Available with high-resolution, high-brightness (cold) field emission guns
  • Available with Dual EDS for highest analytical throughput

 Data Sheet

Talos F200S TEM

  • Precise chemical composition data
  • High-performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

 Data Sheet

Talos F200X TEM

  • High-quality, high-resolution (S)TEM imaging and accurate EDS
  • Available with high-resolution, high-brightness (cold) field emission gun
  • Available with in-column Super-X G2 EDS with ultimate cleanliness
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 Data Sheet

Talos F200C TEM

  • Flexible EDS analysis reveals chemical information
  • High-contrast, high-quality TEM and STEM imaging
  • Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

 Data Sheet

Dual Beam Electron Microscopes

Thermo Fisher Scientific is the industry leader in Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) technology with more than 30 years of experience with DualBeams. The technology's novel ability to reveal subsurface structural detail, by making precise cuts with a FIB and then imaging the exposed surface with a high-resolution SEM, has led to its acceptance by researchers and engineers in a wide variety of applications. With more than 2,000 Thermo Scientific systems installed around the world, Thermo Fisher's DualBeams continue to lead the market with cutting-edge capabilities built on technical innovation and a deep store of application knowledge gathered over years of collaborative development with our customers.

   Dual Beams Portfolio

ExSolve WTP DualBeam

  • Can prepare site-specific, 20 nm thick lamellae on whole wafers up to 300 mm in diameter
  • Addresses needs requiring automated, high-throughput sampling at advanced technology node

 Data Sheet

Helios 5 EXL DualBeam

  • Low-voltage performance for high sample preparation quality
  • Ultra-high-resolution immersion-lens field-emission SEM column
  • Automated handling of 300 mm FOUP with EFEM (GEM300 compliant)

 Data Sheet

Helios 5 DualBeam

  • Fully automated, high-quality, ultra-thin TEM sample preparation
  • High throughput, high-resolution subsurface and 3D characterization
  • Rapid nanoprototyping capabilities
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 Data Sheet

Helios 5 PFIB DualBeam

  • Gallium-free STEM and TEM sample preparation
  • Multi-modal subsurface and 3D information
  • Next-generation 2.5 μA xenon plasma FIB column
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 Data Sheet

Helios 5 Hydra DualBeam

  • 4 fast switchable ion species (Xe, Ar, O, N) for optimized PFIB processing of a widest range of materials
  • Ga-free TEM sample preparation
  • Extreme high resolution SEM imaging
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 Data Sheet

FIB-SEM and Laser Ablation

  • All three beams have same coincident point for accurate and repeatable cut placement
  • mm-scale cross sections with up to 15,000x faster material removal
  • Statistically relevant deep subsurface and 3D data analysis

 Data Sheet

Arctis Cryo-Plasma-FIB

  • Correlation to light microscopy and relocation in TEM
  • High-quality lamellae with consistent thickness
  • Automated high throughput and connectivity for cryo-tomography
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 Data Sheet

Aquilos 2 Cryo-FIB

  • Automation enables production of multiple lamellas
  • Target and extract your structure of interest with lift-out nano-manipulator
  • 3D visualization for high-resolution tomography

 Data Sheet

Scios 2 DualBeam

  • Full support of magnetic and non-conductive samples
  • High throughput subsurface and 3D characterization
  • Advanced ease of use and automation capabilities
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 Data Sheet

 

 

Contact Us

 Salah Alden Road | Al Zahra District 

Riyadh | Kingdom of Saudi Arabia

 60001 Riyadh 11545

 afms@afmssc.com

 +966 (0) 11 476 7777