Helios 5 Hydra DualBeam

Floor Standing Electron Microscopes

Complete portfolio of floor standing electron microscopes including Scanning Electron Microscopes (SEMs), Transmission Electron Microscopes (TEMs) and Dual Beam Focused Ion Beam (FIB) Scanning Electron Microscopes.

Scanning Electron Microscopes

Thermo Scientific™ Floor Standing SEM models offer the flexibility and versatility to meet a wide range of academic and industrial needs; support for large and heavy samples, a very wide range of accessories, excellent imaging quality for the most challenging materials or the smallest details, and dynamic experimentation.

Scanning Electron Microscopes General Portfolio

Axia ChemiSEM

Live quantitative elemental mapping

High fidelity scanning electron microscopy imaging

Flexible and easy to use, even for novice users

Easy maintenance

Data Sheet

Verios 5 XHR SEM

Monochromated SEM for sub-nanometer resolution over the full 1 keV to 30 keV energy range

Easy access to beam landing energies as low as 20 eV

Excellent stability with piezo stage as standard

Data Sheet

Quattro ESEM

Ultra-versatile high-resolution FEG SEM with unique environmental capability (ESEM)

Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation

Data Sheet

Prisma E SEM

Entry-level SEM with excellent image quality

Easy and quick sample loading and navigation for multiple samples

Compatible with a wide range of materials thanks to dedicated vacuum modes

Data Sheet

Apreo 2 SEM

High-performance SEM for all-round nanometer or sub-nanometer resolution

In-column T1 backscatter detector for sensitive materials contrast

Excellent performance at long working distance (10 mm)

Data Sheet

VolumeScope 2 SEM

Isotropic 3D data from large volumes

High contrast and resolution in high and low vacuum modes

Simple switch between normal SEM use and serial block-face imaging

Data Sheet

Transmission Electron Microscopes

Transmission electron microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image. The electron beam is impacted by the sample’s thickness/density, composition, and in some cases, crystallinity. The electrons that are transmitted through the specimen subsequently provide contrast in the resulting image.

Transmission Electron Microscopes can routinely collect sub-nanometer scale (if not atomic-resolution) images.

Tundra Cryo-TEM

Structural information at biologically relevant resolution

Space efficient and cost effective

Easy, iterative sample optimization

Unique AI algorithms for streamlined data collection

Data Sheet

Krios G4 Cryo-TEM

Improved ergonomics

Fits more easily into new and existing labs

Maximized productivity and automation

Best image quality for high-resolution 3D reconstruction

Data Sheet

Spectra Ultra TEM

New imaging and spectroscopy capabilities on the most beam sensitive materials

A leap forward in EDX detection with Ultra-X

Column designed to maintain sample integrity

Data Sheet

Spectra 300 TEM

Highest-resolution structural and chemical information at the atomic level

Flexible high-tension range from 30-300 kV

Three lens condenser system

Data Sheet

Spectra 200 TEM

High-resolution and contrast imaging (voltage 30-200 kV)

Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm

Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

Data Sheet

Glacios 2 Cryo-TEM

High-resolution structure determination tool (<3Å)

Unparalleled ease-of-use through AI-enhanced automation

Flexible modes of operation standard: SPA, tomography, MicroED

Data Sheet

Metrios AX TEM

Automation options to support quality, consistency, metrology, and reduced OPEX

Workflows for both in-situ and ex-situ lamella preparation

Leverages machine learning for superior autofunctions

Data Sheet

Talos L120C TEM

Increased stability

4k × 4K Ceta CMOS camera

TEM magnification range from 25–650 kX

Flexible EDS analysis reveals chemical information

Data Sheet

Talos F200i TEM

High-quality, high-resolution (S)TEM imaging and flexible EDS

Available with high-resolution, high-brightness (cold) field emission guns

Available with Dual EDS for highest analytical throughput

Data Sheet

Talos F200S TEM

Precise chemical composition data

High-performance imaging and precise compositional analysis for dynamic microscopy

Features Velox Software for fast and easy acquisition and analysis of multimodal data

Data Sheet

Talos F200X TEM

High-quality, high-resolution (S)TEM imaging and accurate EDS

Available with high-resolution, high-brightness (cold) field emission gun

Available with in-column Super-X G2 EDS with ultimate cleanliness

Data Sheet

Talos F200C TEM

Flexible EDS analysis reveals chemical information

High-contrast, high-quality TEM and STEM imaging

Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

Data Sheet

Dual Beam Electron Microscopes

Thermo Fisher Scientific is the industry leader in Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) technology with more than 30 years of experience with DualBeams. The technology's novel ability to reveal subsurface structural detail, by making precise cuts with a FIB and then imaging the exposed surface with a high-resolution SEM, has led to its acceptance by researchers and engineers in a wide variety of applications. With more than 2,000 Thermo Scientific systems installed around the world, Thermo Fisher's DualBeams continue to lead the market with cutting-edge capabilities built on technical innovation and a deep store of application knowledge gathered over years of collaborative development with our customers.

Dual Beams Portfolio